Hitachi High-Tech launches the SU3900SE and SU3800SE series high-resolution schottky scanning electron microscopes

Hitachi High-Tech Corporation announced the launch of the SU3900SE and SU3800SE High-Resolution Schottky field emission- scanning Electron Microscopes. The SU3900SE specimen stage has been redesigned to enable operators to observe heavy specimens up to 5 kg. The specimen stage is the largest in Hitachi High-Tech's scanning electron microscope (SEM) offerings, making it suitable for large specimens up to 300 mm in diameter and 130 mm in height, which is around 1.5 times larger when compared to its SU5000 predecessor. This feature enables to reduce the need for additional specimen preparations such as cutting specimens, helping to make the overall process more efficient. In addition to enabling the observation of large and heavy specimens, the specimen is controlled by a 5-axis motorized stage (X, Y, Z, tilt, and rotation).

The new microscopes also feature a camera navigation function that stitches together separate images to allow viewing of the entire specimen, helping the operators with identifying points of interest when observing large specimens, providing improved usability.

The environmentally friendly design of the new instruments allows for reduced CO₂ emissions by reducing power consumption to 2 kVA, around 50% compared to existing FE-SEM models, while still maintaining high-performance requirements.